J. Phys. III France
Volume 2, Numéro 9, September 1992
Page(s) 1591 - 1603
DOI: 10.1051/jp3:1992201
J. Phys. III France 2 (1992) 1591-1603

Measurements of relative intensity noise (RIN) in semiconductor lasers

Irène Joindot

CNET-LAB/OCM, route de Trégastel, BP 40, F-22301 Lannion, France

(Received 14 November 1991, accepted 30 March 1992)

The intensity fluctuations of the laser diodes light are characterized by the so-called relative intensity noise (RIN). In this paper a very accurate measurement technique is presented and results are given on some components. RIN measurements on isolated longitudinal modes can explain how the energy is shared between the modes.

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