J. Phys. III France
Volume 2, Numéro 9, September 1992
Page(s) 1779 - 1786
DOI: 10.1051/jp3:1992212
J. Phys. III France 2 (1992) 1779-1786

A simple system to measure internal friction and creep

A. M. Bastawros and M. Z. Said

Physics Department, National Research Centre, Dokki, Giza, Egypt

(Received 5 November 1991, revised 21 April 1992, accepted 23 April 1992)

A system is described to measure internal friction and creep of thin materials. The detection is based on the variation in collector current with the capacitance of the tuned circuit of a tuned collector crystal oscillator. The mechanical systems used to realize those measurements are described. A high sensitivity is obtained for the different modes of solicitation.

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