| Numéro |
J. Phys. III France
Volume 2, Numéro 9, September 1992
|
|
|---|---|---|
| Page(s) | 1779 - 1786 | |
| DOI | https://doi.org/10.1051/jp3:1992212 | |
DOI: 10.1051/jp3:1992212
J. Phys. III France 2 (1992) 1779-1786
Physics Department, National Research Centre, Dokki, Giza, Egypt
© Les Editions de Physique 1992
J. Phys. III France 2 (1992) 1779-1786
A simple system to measure internal friction and creep
A. M. Bastawros and M. Z. SaidPhysics Department, National Research Centre, Dokki, Giza, Egypt
(Received 5 November 1991, revised 21 April 1992, accepted 23 April 1992)
Abstract
A system is described to measure internal friction and creep of thin materials. The detection is based on the variation in
collector current with the capacitance of the tuned circuit of a tuned collector crystal oscillator. The mechanical systems
used to realize those measurements are described. A high sensitivity is obtained for the different modes of solicitation.
© Les Editions de Physique 1992