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Multicouche thermique et profils thermophysiques continus : l'approche récursive p. 13 Philippe Grossel, Françoise Depasse and Nathalie Trannoy DOI: https://doi.org/10.1051/jp3:1997107 AbstractPDF (1.230 MB)References
Analyse de l'état mécanique et microstructural de films minces supraconducteurs YBa$\mathsf{_2}$ Cu$\mathsf{_3}$O$\mathsf{_7}$ par diffraction des rayons X p. 35 S. Auzary, K.F. Badawi, L. Bimbault, J. Rabier, R.J. Gaboriaud and Ph. Goudeau DOI: https://doi.org/10.1051/jp3:1997108 AbstractPDF (641.7 KB)References
Diffusion and Electrical Activation After a Rapid Thermal Annealing of an As and B-Co-Implanted Polysilicon Layer p. 47 C. Gontrand, P. Sellitto, S. Tabikh, S. Latreche and A. Kaminski DOI: https://doi.org/10.1051/jp3:1997109 AbstractPDF (618.1 KB)References
Internal Friction and Young's Modulus of Some Rapidly Solidified Al-Si Alloys p. 59 N.L. Tawfik, E.M. Abdel Hady and A.M. Bastawros DOI: https://doi.org/10.1051/jp3:1997110 AbstractPDF (343.2 KB)References
Modelling of Magnetostrictive Thin Films, Application to a Micromembrane p. 67 Christophe Body, Gilbert Reyne and Gérard Meunier DOI: https://doi.org/10.1051/jp3:1997111 AbstractPDF (1023 KB)References
Laser-Induced Reactivity of NH$\mathsf{_3}$ on GaAs Surface p. 87 L. Vivet, B. Dubreuil, T. Gibert-Legrand, M.F. Barthe and C. Perrin DOI: https://doi.org/10.1051/jp3:1997112 AbstractPDF (749.4 KB)References
Magnétomètre à $^3$He pompé par diode laser p. 99 O. Moreau, B. Chéron, H. Gilles, J. Hamel and E. Noël DOI: https://doi.org/10.1051/jp3:1997113 AbstractPDF (1017 KB)References
A $\delta$-Doped Substructure in Solar Cells: Carriers Confinement and Photocurrent p. 117 F. Pélanchon, Y. Moreau and P. Mialhe DOI: https://doi.org/10.1051/jp3:1997114 AbstractPDF (727.2 KB)References
Negative Magnetoresistance in Silicon Doped AlAs-GaAs Short Period Superlattices p. 133 A.B. Gougam, J. Sicart and J.L. Robert DOI: https://doi.org/10.1051/jp3:1997115 AbstractPDF (485.0 KB)References
Étude des convertisseurs multicellulaires parallèles : I. Modélisation p. 143 Pascal Davancens and Thierry Meynard DOI: https://doi.org/10.1051/jp3:1997116 AbstractPDF (839.0 KB)References
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Modélisation et incertitude : comparison de deux méthodes pour l'estimation de la confiance des résultats des modèles numériques p. 179 P. Aude, P. Depecker and G. Krauss DOI: https://doi.org/10.1051/jp3:1997118 AbstractPDF (812.1 KB)References
Regimes of Arc Plasma Flow at Low Pressure p. 195 A. Kamiñska and M. Dudeck DOI: https://doi.org/10.1051/jp3:1997119 AbstractPDF (763.0 KB)References
Holography and Holographic Interferometry with a near IR Sentitive photopolymer System p. 211 István Bányász, Daniel-Joseph Lougnot and Colette Turck DOI: https://doi.org/10.1051/jp3:1997120 AbstractPDF (1.032 MB)References
