Journal de Physique III

F. E. Christensen, S. Abdali, P. K. Frederiksen, A. Hornstrup, I. Rasmussen, N. J. Westergaard, H. W. Schnopper, E. Louis, H.-J. Voorma, N. Koster et al. (10 more)

DOI: https://doi.org/10.1051/jp3:1994227

Soft X-ray spectroscopy p. 1613

D. S. Urch

DOI: https://doi.org/10.1051/jp3:1994228

X-ray gratings and projection lithography by means of laterally structured multilayers p. 1625

U. Heinzmann

DOI: https://doi.org/10.1051/jp3:1994229

High resolution X-ray diffraction of one- and two-dimensional periodic surface gratings p. 1639

P. van der Sluis

DOI: https://doi.org/10.1051/jp3:1994230

Multilayer diffraction grating properties p. 1649

A. Erko, V. Martynov, D. Roshchoupkin, A. Yuakshin, B. Vidal, P. Vincent and M. Brunel

DOI: https://doi.org/10.1051/jp3:1994217

Recent advances in etched multilayer X-ray optics p. 1659

J. M. André, A. Sammar, S. Bac, M. Ouahabi, M. Idir, G. Soullié and R. Barchewitz

DOI: https://doi.org/10.1051/jp3:1994231

Laser plasma sources for soft X-ray projection lithography p. 1669

F. Bijkerk, L. Shmaenok, A. van Honk, R. Bastiaensen, Yu. Ya. Platonov, A. P. Shevelko, A. V. Mitrofanov, F. Voß, R. Désor, H. Frowein and B. Nikolaus

DOI: https://doi.org/10.1051/jp3:1994232

The HELIOS series of advanced, synchrotron based, X-ray sources p. 1679

V. C. Kempson, A. R. Jorden, N. C. E. Crosland, M. N. Wilson, J. C. Schouten, M. C. Townsend and R. J. Anderson

DOI: https://doi.org/10.1051/jp3:1994233

Effets de compétition entre les phénomènes de dopage et d'endommagement dans les polymères électroactifs implantés p. 1689

A. Moliton, C. Moreau, B. Lucas, R. H. Friend and G. Froyer

DOI: https://doi.org/10.1051/jp3:1994234

Etude par pompage de, charge des défauts induits à l'interface Si-SiO$\mathsf{_2}$ par rayonnements ionisants p. 1707

Jean-Luc Autran, Bernard Balland, Jean-Pierre Vallard and Daniel Babot

DOI: https://doi.org/10.1051/jp3:1994235

Simulation du comportement thermique en régime permanent d'un moteur asynchrone à refroidissement extérieur. Etude par éléments finis p. 1723

R. Glises, G. Hostache and J.M. Kauffmann

DOI: https://doi.org/10.1051/jp3:1994236

Contribution de la mesure de température par micro-sonde thermoélectrique a la microscopie thermique p. 1737

L. Thiery, J. P. Prenel and R. Porcar

DOI: https://doi.org/10.1051/jp3:1994237

Evaluation of real-space images of Pt-single crystals produced by backscattered electrons in the kiloelectronvolt range p. 1751

Markus Lambrigger

DOI: https://doi.org/10.1051/jp3:1994238

Test of a recoil ion source at GANIL medium energy facility p. 1765

A. Gosselin, P. Boduch, D. Hennecart, S. Hicham, X. Husson, D. Lecler, A. Lepoutre, A. Cassimi and J. P. Grandin

DOI: https://doi.org/10.1051/jp3:1994239

Journal de Physique III

Volume 4 / No 9 (September 1994)

Characterization of thin films and multilayers by specular X-ray reflectivity p. 1503

Curvature effect in grazing X-ray reflectometry p. 1513

Use of Fourier transfoim in grazing X-rays reflectometry p. 1523

Thin layer diffraction p. 1533

X-ray diffuse scattering as a probe for thin film and interface structure p. 1543

Influence of roughness profile on reflectivity and angle-dependent X-ray fluorescence p. 1559

X-ray characterization of semiconductor surfaces and interfaces p. 1565

Diffuse X-ray scattering of amorphous multilayers p. 1573

X-ray waveguide structures of thin metal-carbon layers p. 1581

Design and manufacture of sputtered multilayers for applications to soft X-ray optics p. 1589

Some applications of nanometer scale structures for current and future X-ray space research p. 1599